Keysight’s 4881HV wafer test system enables parametric tests up to 3 kV, accommodating both high and low voltage in a single pass. Its high-voltage switching matrix facilitates this one-pass operation, boosting productivity and efficiency.
The system’s switching matrix scales up to 29 pins and integrates with precision source measure units, allowing flexible measurements from low current down to sub-pA resolution at up to 3 kV on any pin. High-voltage capacitance measurements with up to 1-kV DC bias are also possible. This switching matrix enables a single 4881HV to replace separate high-voltage and low-voltage test systems, increasing efficiency while reducing the required footprint and testing time.
Power semiconductor manufacturers can use the 4881HV to perform process control monitoring and wafer acceptance testing up to 3 kV, meeting the future requirements of automotive and other advanced applications. To safeguard operators and equipment during tests, the system features built-in protection circuitry and machine control, ensuring they are not affected by high-voltage surges. Additionally, it complies with safety regulations, including SEMI S2 standards.
To request a price quote for the 4881HV test system, click the product page link below.
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