Esterline Research and Design (ER&D) has introduced the FAS2000-TC, a cutting-edge system for testing OCXOs. The FAS2000-TC can be used for testing frequency-based parameters such as frequency vs. temperature, ADEV, and warm-up at production volumes. This OCXO frequency acquisition system is an upgrade to ER&D’s FAS200 test architecture by integrating a temperature control chamber, enabling comprehensive testing of traditional OCXO parameters across varying temperatures.
The FAS2000-TC is the ideal solution for manufacturers seeking efficiency, accuracy, and scalability in OCXO testing. Its integrated temperature-controlled chamber ensures precise performance evaluation across a wide temperature range, while multi-unit testing reduces costs per channel and accelerates production cycles. The system tracks key parameters such as frequency stability and calculates critical metrics like Allan Deviation (ADEV) for precision validation. Designed for flexibility, it supports various OCXO packages, offers customizable configurations, and seamlessly scales from small-batch testing to high-volume production, making it a cost-effective and high-performance choice for OCXO manufacturers.
Key Features: –
- Simultaneous frequency acquisition
- Zero-dead-time readings
- Independent counter per channel
- Five-Card Backplane
- 8 or 16 DUTs per card
- DIN connectors for robust swapping
- Enables wider testing capability: – Frequency vs. Temperature, ADEV, MTIE, Warm-up, TDEV, Microjumps
The FAS2000-TC has a five-card backplane, with each backplane having up to 8 or 16 DUTs per card, which connect to the backplane using DIN connectors and feature multiple slots for concurrent OCXO measurement. Each channel offers individually programmable EFC and VCC voltages, along with VCC current measurement, allowing for automated test parameter configuration. All OCXO footprints can be supported through cost-effective adapters, enabling simultaneous testing of multiple package types and parameter profiles, thereby optimizing production efficiency. System data transmission is managed by an MCM100 module (master controller).
Optimized for industries reliant on precision timing, the FAS2000-TC streamlines temperature qualification, ensuring accurate performance assessment. It enables simultaneous testing of multiple OCXOs, significantly improving efficiency and reducing costs compared to single-channel systems. The system’s zero dead-time readings allow entire production lots to be evaluated for key metrics like frequency stability and Allan Deviation (ADEV).
This OCXO test system enables temperature qualification of systems based on precision timing applications such as GPS, Radar, Radios, Guided Munitions, SATCOM, Cellular Infrastructure, Stratum-Compliant Devices, SARSAT, Test Instrumentation, Quantum Computing, and A.I. Data Centers.
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