MPI Corporation’s Advanced Semiconductor Test (AST) Division, a provider of high-frequency probing solutions, offers versatile AC-series RF Calibration Substrates. Developed to meet the specific application needs of on-wafer RF and microwave measurements, the AC-series provides an accurate and comprehensive set of calibration standards for the semiconductor industry.
The AC-series of calibration substrates offers up to 26 sets of standards for wafer-level SOLT, LRM probe-tip calibration for GS/SG and GSG probes. Five coplanar lines provide the broadband reference multiline TRL calibration as well as accuracy verification of conventional methods.
Right-angled reciprocal elements are added to support the SOLR calibration of the system with the right-angled configuration of RF probes. The calibration substrate for wide-pitch probes is also available.
RF Calibration Substrates Product Portfolio:
MPI offers two main families of these substrates, each catering to distinct calibration needs:
- AC-Series (AC-2, AC-3, AC-5): These calibration substrates are designed for wafer-level SOLT, LRM, and probe-tip calibration for GS/SG and GSG probes. They include five coplanar lines for the highly accurate, broadband Multiline TRL calibration and feature right-angled reciprocal elements to support the SOLR calibration method for right-angled RF probes.
- TCS-GSGSG / TCS-GSSG Series: These specialised substrates, such as the TCS-GSG-0100-0250-THRU and TCS-GSG-0100-0250-SOLR, provide dedicated standards for various pitch configurations and calibration types (like SOLR), ensuring accurate results for a wide range of specific test requirements.
These products are essential tools that address the demands for high-frequency measurement accuracy in applications such as 5G/6G, RF-mmWave, and advanced device characterization.